Point Source Sensitivity for MIPS
Photometry and Super Resolution AOT:
Small Field Option
Go to the "Large Field" Sensitivity
Estimates
The following charts give the MIPS point source sensitivity
in the photometry and super resolution observing mode. Separate charts are
given for each of the three wavelength bands and the available pixel
scales and dither options. The individual points are located at the
effective integration times for 1, 2, 3, 4, .... cycles of the dither
pattern. Super resolution measurements at 70 microns must be made with the
fine pixel scale (4.9"/pixel). Full sampling of the point spread function
at 24 and 160 microns is accomplished through the standard dither
patterns.
Each exposure cycle provides multiple exposures resulting in a minimum
integration time that is longer than the selected single frame exposure
time. These multiple exposure integration times are reflected in the
quantized points on the sensitivity charts.
The Spitzer Observer's
Manual summarizes the frames per observation cycle and the integration
time per pixel for the various photometry and super resolution modes.
Background point source confusion is a function of the location on the
sky. The confusion limits shown should be considered optimistic lower
limits. See note on confusion limits here.
The "large field" option is intended
for sources too spatially extended to obtain background measurements
within the array fields of view. We show on this page the sensitivities
for the small field option only.
Go to the "Large Field" Sensitivity
Estimates
Small Field Option Sensitivities:
See note on confusion limits here.
- Low Background:
- 24 micron
70 micron (default scale)
70 micron (fine scale)
160 micron
- Medium Background:
- 24 micron
70 micron (default scale)
70 micron (fine scale)
160 micron
- High Background:
- 24 micron (note that 30
seconds is too long an exposure for the high-background case)
70 micron (default scale)
70 micron (fine scale)
160 micron
Go back to MIPS page
| 
