MIPS : Sensitivity

Point Source Sensitivity for MIPS
Photometry and Super Resolution AOT:
Small Field Option

Go to the "Large Field" Sensitivity Estimates

The following charts give the MIPS point source sensitivity in the photometry and super resolution observing mode. Separate charts are given for each of the three wavelength bands and the available pixel scales and dither options. The individual points are located at the effective integration times for 1, 2, 3, 4, .... cycles of the dither pattern. Super resolution measurements at 70 microns must be made with the fine pixel scale (4.9"/pixel). Full sampling of the point spread function at 24 and 160 microns is accomplished through the standard dither patterns.

Each exposure cycle provides multiple exposures resulting in a minimum integration time that is longer than the selected single frame exposure time. These multiple exposure integration times are reflected in the quantized points on the sensitivity charts.

The Spitzer Observer's Manual summarizes the frames per observation cycle and the integration time per pixel for the various photometry and super resolution modes.

Background point source confusion is a function of the location on the sky. The confusion limits shown should be considered optimistic lower limits. See note on confusion limits here.

The "large field" option is intended for sources too spatially extended to obtain background measurements within the array fields of view. We show on this page the sensitivities for the small field option only.

Go to the "Large Field" Sensitivity Estimates

Small Field Option Sensitivities:

See note on confusion limits here.

Low Background:

24 micron
70 micron (default scale)
70 micron (fine scale)
160 micron

Medium Background:

24 micron
70 micron (default scale)
70 micron (fine scale)
160 micron

High Background:

24 micron (note that 30 seconds is too long an exposure for the high-background case)
70 micron (default scale)
70 micron (fine scale)
160 micron

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