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Point Source Sensitivity for MIPS
Photometry and Super Resolution AOT:
Large Field Option

Go to the "Small Field" Sensitivity Estimates

The following charts give the anticipated MIPS point source sensitivity in the photometry and super resolution observing mode. Separate charts are given for each of the three wavelength bands and the available pixel scales and dither options. The individual points are located at the effective integration times for 1, 2, 3, 4, .... cycles of the dither pattern. Super resolution measurements at 70 microns must be made with the fine pixel scale (4.9"/pixel). Full sampling of the point spread function at 24 and 160 microns is accomplished through the standard dither patterns.

Each exposure cycle provides multiple exposures resulting in a minimum integration time that is longer than the selected single frame exposure time. These multiple exposure integration times are reflected in the quantized points on the sensitivity charts.

Tthe Spitzer Observer's Manual summarizes the frames per observation cycle and the integration time per pixel for the various photometry and super resolution modes.

Background point source confusion is a function of the location on the sky. The confusion limits shown should be considered optimistic lower limits. See note on confusion limits here.

The "large field" option is intended for sources too spatially extended to obtain background measurements within the array fields of view. We show here the sensitivities for the large field option only. The large field will produce the same sensitivities for equivalent on-source integration times as the small field option. Exact large field sensitivities will depend on how the background is subtracted and measured from the data. The sensitivities given here are for on-source data only, with no background subtraction assumed. A factor 1.4 should be multiplied to the on-source integration time to account for a simple arithmetic background subtraction.

Go to the "Small Field" Sensitivity Estimates


Large Field Option Sensitivities:

See note on confusion limits here.

Low Background:
24 micron
70 micron (default scale)
70 micron (fine scale)
160 micron

Medium Background:
24 micron
70 micron (default scale)
70 micron (fine scale)
160 micron

High Background:
24 micron (note that 30 seconds is too long an exposure for the high-background case)
70 micron (default scale)
70 micron (fine scale)
160 micron


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This file was last modified on Thu Sep 28 12:39:29 2006.

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