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Sunday, Jan. 4, 2004:
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1:45-2:00 pm
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Registration, setup
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2:00-2:30 pm
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Spitzer Overview: general
information. Instrument
capabilities. Orbit. Pointing constraints. Modes
of operation, observation, and proposing. IOC/SV,
FLS, Legacy, GTO, GO
programs. ToO. Tools. Comparsion with, e.g.,
ISO. Support. Scheduling. Constraints
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G. Squires
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2:30-3:00 pm
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IRAC: imaging at 3.6-8 microns. Instrument
overview, wavelength coverage, sensitivity,
saturation, latents. Limitations. Data
products/analysis. Calibration. Overview of AOT.
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W. Reach
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3:00-3:30 pm
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IRS: Spectroscopy. Instrument
overview, wavelength coverage, sensitivity,
saturation, latents. Limitations. Data
products/analysis. Calibration. Overview of AOTs.
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D. W. Hoard
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3:30 - 4:00 pm
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MIPS: imaging at 24-160 microns. Instrument
overview, wavelength coverage, sensitivity,
saturation, latents. Limitations. Data
products/analysis. Calibration. Overview of AOTs.
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L. M. Rebull
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4:00-4:30 pm
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Break/interaction with SSC staff
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4:30 - 6:00 pm
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Hands-on interactive observation planning: SPOT
demos. Examples of designing imaging,
spectroscopy observations. Proposal submission.
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SSC staff
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